Characterisation and reliability
- 13:00 Characterization of a pH sensor based on an AlGaN/GaN transistor
- Javier Eroles (ISOM), Ana Bengoechea (ISOM), Miguel Ángel Sánchez (ISOM), Fernando Calle (ISOM).
- 13:20 Channel Hot-Carrier degradation in short channel devices with high-k/metal gate stacks
- Esteve Amat (UAB), Thomas Kauerauf (IMEC), Robin Degraeve (IMEC), Rosana Rodríguez (UAB), Montserrat Nafría (UAB), Xavier Aymerich (UAB), Guido Groeseneken (IMEC).
- 13:40 Static and Dynamic Analysis of Split-Gate RESURF Stepped Oxide (RSO) MOSFETs for 35 V Applications
- Chin Foong Tong (University of Warwick), Ignacio Cortes (LAAS-CNRS), Philip Andrew Mawby (University of Warwick), James Anthony Covington (University of Warwick), Frédéric Morancho (LAAS-CNRS).